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High energy ion scattering yields (HEIS) and X ray photoelectron intensities (XPS) from simulated bimetallic surfaces using Monte Carlo methods: Thin Ni films on Al(110)

Authors: 
V. Shutthanandan
Adli A. Saleh
R. J. Smith
Conference: 
March meeting of the American physical society
Location: 
Pittsburgh, PA
Date: 
Monday, March 21, 1994
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